Powder X: Ray Diffraction

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Powder X–Ray Diffraction Powder X–ray diffraction (PXRD) was used to provide an insight into the polymorphic nature of xylitols. The PXRD patterns of all xylitols were collected on a Bruker D8 Advance (Siemens, D5000, Germany) powder diffractometer with Cu Kα radiation (1.54056 Å) using the DIFFRACplus software. Samples were placed into a stainless steel holder and the surface of each powder was levelled manually for analysis. Each sample was scanned from 2 to 40 of 2θ with a step size of 0.019º and a step time of 32.5 s. The reproducibility of the PXRD patterns was ascertained by collecting three patterns of three different specimens of each sample. Fourier Transforms Infrared Spectroscopy FT–IR analysis was carried out by to identify any changes at a molecular level between crystallized xylitol crystals. All xylitols were analyzed using a computerized fourier transforms infrared (FT–IR) spectrometer (SPECTRUM–ONE FT–IR, PerkinElmer, Massachusetts, USA) at room temperature. The scanning range was 650–4,000 cm-1 and the resolution was 1 cm-1 resolution. Each sample (several milligrams) was placed on the middle of the sample stage. The handle attached was placed on top of the sample and a force gauge was applied (50 ± 2 bar arbitrary units of the device’s pressure meter) by the top of the arm of the sample stage to make the necessary contact to yield a characteristic spectrum. After obtaining sharp peaks with reasonable intensities, the spectra acquired were the results of
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