The Physics Of Atomic Force Microscopy

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Abstract
Atomic Force Microscopy was the method used to analyze samples inorder to identify their surface composition and determine their top structure. Compiled data was used to calculate the roughness of the sample. Introduction
Atomic Force Microscopy is a powerful tool used to identify the surface structure of a solid by contouring the top layer with a sharp tipped probe and amplifying the hills and troughs via laser reflection and detection. Piezoelec-tric materials are used to finely tune the x and y distance parameters, and a harmonic oscillator is utilized in close contact mode to move the cantilever in the z direction. A Scanning Probe Microscopy program processes the data and calculates the roughness of the sample

Background
Gustav Schmalz designed the first Optical Profiler in 1929 in Germany. He ran a probe attached to a cantilever across the surface, shined white light to a mirror attached to the probe, and amplified the signal to photographic film. The film was exposed to the reflected light of various wavelengths, causing multiple colors to show up on the film, corresponding to varying heights on the surface. This older design was subject to possible bending or crashing of the probe, causing a much lower resolution of the surface on the film. Refer to Figure 1.
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