Physics Of X Ray Fluorescence

1167 WordsApr 6, 20165 Pages
X-Ray Fluorescence (XRF) Spectrometry The JSX-3222 analyzer is an energy-dispersive fluorescent X-ray spectrometer developed to analyze cadmium (Cd) included in plastic and the electric wire film material, etc. promptly. The range of elements that can be measured is from sodium (Na) to uranium (U).Liquid-nitrogen cooling for the high performance detector is required only during the analyzing time. The vacuum and atmosphere are switched to the measurement atmosphere by the operation of one button. When X-rays (primary X-rays) are illuminated from the X-ray tube to the specimen, fluorescence X-rays having wavelengths (energies) peculiar to the constituent elements of the specimen are generated from the elements. Qualitative analysis can be made by investigating the wavelengths of the fluorescence X-rays and quantitative analysis by investigating the X-ray dose. The energies are investigated by two methods. One is to optically separate them and the other is to use the energy separation characteristic of the X-ray detector. The former is called the wavelength dispersive method an: the latter the energy dispersive method. The element analyzer employs the latter method. As seen from the figure, since the energy dispersive X-ray spectrometer has no moving parts employs a simple optical system, its structure is simple and compact. And since the detector can be installed the specimen, the X-ray solid angle of collection can be made large, thus offering many features such as

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