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A) A solid specimen of dielectric, diclectric constant of 4.5, shown in the figure has an internal void of thickness Imm. The specimen is Icm thick and is subjected to a voltage of 100 kV(ms). If the void is filled with air and if the breakdown strength of air can be taken as 35 kV(peak)/cm, find the voltage at which an internal discharge can occur.

A) A solid specimen of dielectric, diclectric constant of 4.5, shown in the figure has an internal void of thickness Imm. The specimen is Icm thick and is subjected to a voltage of 100 kV(ms). If the void is filled with air and if the breakdown strength of air can be taken as 35 kV(peak)/cm, find the voltage at which an internal discharge can occur.

Introductory Circuit Analysis (13th Edition)
Introductory Circuit Analysis (13th Edition)
13th Edition
ISBN:9780133923605
Author:Robert L. Boylestad
Publisher:Robert L. Boylestad
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A) A solid specimen of dielectric, diclectric constant of 4.5, shown in the figure has an intenal void of thickness Imm. The specimen is lcm thick and is subjected to a voltage of 100 kV(ms). If the void is filled with air and if the breakdown strength of air can be taken as 35 kV(pcak)/cm, find the voltage at which an internal discharge can occur. Imm 10 mm B) A solid specimen of diclectric has a dielectric constant of 4.2, and tan 8= 0.001 at a frequency of 50 Hz. If it is subjected to an altemating field of 50 kV/cm, calculate the heat generated in the specimen due to the dielectric loss.
Transcribed Image Text:A) A solid specimen of dielectric, diclectric constant of 4.5, shown in the figure has an intenal void of thickness Imm. The specimen is lcm thick and is subjected to a voltage of 100 kV(ms). If the void is filled with air and if the breakdown strength of air can be taken as 35 kV(pcak)/cm, find the voltage at which an internal discharge can occur. Imm 10 mm B) A solid specimen of diclectric has a dielectric constant of 4.2, and tan 8= 0.001 at a frequency of 50 Hz. If it is subjected to an altemating field of 50 kV/cm, calculate the heat generated in the specimen due to the dielectric loss.
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