Th an experiment to measure the wavelength of light using a double slit optical system, the source (S) is placed on the perimeter of a semicircle of radius R, whose center (C) is located in the middle point of two narrow slits. The slits are separated by a distance d = 2,5x10 m and an interference pattem is obtained on a distant screen. The position of the source (S) on the semicircle is changed during the experiment, and the resulting intensity of the light at the center of the screen (at point P) is measured as a function of the angle 0 between the segment connecting the source to the center of the semicircle (SC) and the horizontal segment TC (see figure). I(0) The graph below shows the measured normalized intensity ) of light at point P as a function of 0. Assume that d «R and that the angle 0 is very small so sin 0 0. Normalized Intensity al pontP 0.1 -0.2 Source Screen What is the wavelength of the source?

Th an experiment to measure the wavelength of light using a double slit optical system, the source (S) is placed on the perimeter of a semicircle of radius R, whose center (C) is located in the middle point of two narrow slits. The slits are separated by a distance d = 2,5x10 m and an interference pattem is obtained on a distant screen. The position of the source (S) on the semicircle is changed during the experiment, and the resulting intensity of the light at the center of the screen (at point P) is measured as a function of the angle 0 between the segment connecting the source to the center of the semicircle (SC) and the horizontal segment TC (see figure). I(0) The graph below shows the measured normalized intensity ) of light at point P as a function of 0. Assume that d «R and that the angle 0 is very small so sin 0 0. Normalized Intensity al pontP 0.1 -0.2 Source Screen What is the wavelength of the source?