1 The expectation of the number of defective devices is given by the formula P T = N[₁ - (₁ - 2N)"] ΩΝ where P is the probability that the trial of one device is considered successful, 2 is the average number of successful trials until the first failure occurs, N is the number of devices tested and m is the number of trials (successes and failures) for each device. 138 FUNCTIONS OF RANDOM VARIABLES Using the linearization method, find the dependence of the expectation and variance of the random variable T on m if N, P and 2 are independent random variables, whose expectations and variances are: M[N] = 5, M[P] = 0.8, Μ[Ω] = 4, D[N] = 1, D[P] = 0.1, D[P] = 0.2.

1 The expectation of the number of defective devices is given by the formula P T = N[₁ - (₁ - 2N)"] ΩΝ where P is the probability that the trial of one device is considered successful, 2 is the average number of successful trials until the first failure occurs, N is the number of devices tested and m is the number of trials (successes and failures) for each device. 138 FUNCTIONS OF RANDOM VARIABLES Using the linearization method, find the dependence of the expectation and variance of the random variable T on m if N, P and 2 are independent random variables, whose expectations and variances are: M[N] = 5, M[P] = 0.8, Μ[Ω] = 4, D[N] = 1, D[P] = 0.1, D[P] = 0.2.

College Algebra

7th Edition

ISBN:9781305115545

Author:James Stewart, Lothar Redlin, Saleem Watson

Publisher:James Stewart, Lothar Redlin, Saleem Watson

Chapter9: Counting And Probability

Section9.3: Binomial Probability

Problem 2E: If a binomial experiment has probability p success, then the probability of failure is...

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