A technique used in observing trace elements, isotopes and atomic monolayers based on the secondary ions that are ejected from the sample. O XRD O AFM SEM O SIMS O XPS ONLO ELLIPSOMETRY

Fundamentals Of Analytical Chemistry
9th Edition
ISBN:9781285640686
Author:Skoog
Publisher:Skoog
Chapter28: Atomic Spectroscopy
Section: Chapter Questions
Problem 28.4QAP
icon
Related questions
Question
A technique used in observing trace elements, isotopes and atomic
monolayers based on the secondary ions that are ejected from the
sample.
XRD
AFM
SEM
SIMS
ELLIPSOMETRY
XPS
NLO
It is a solid surface on which the stationary phase is bound or coated.*
mobile phase
column
> supporting medium
stationary phase
XPS can be used for the following analyses except-*
Contamination in the surface or the bulk of the sample
Functional group of the sample
Binding energy of electronic states
Thickness of materials
Density of electronic states
Transcribed Image Text:A technique used in observing trace elements, isotopes and atomic monolayers based on the secondary ions that are ejected from the sample. XRD AFM SEM SIMS ELLIPSOMETRY XPS NLO It is a solid surface on which the stationary phase is bound or coated.* mobile phase column > supporting medium stationary phase XPS can be used for the following analyses except-* Contamination in the surface or the bulk of the sample Functional group of the sample Binding energy of electronic states Thickness of materials Density of electronic states
Expert Solution
steps

Step by step

Solved in 3 steps

Blurred answer
Knowledge Booster
Group 1 Elements
Learn more about
Need a deep-dive on the concept behind this application? Look no further. Learn more about this topic, chemistry and related others by exploring similar questions and additional content below.
Similar questions
  • SEE MORE QUESTIONS
Recommended textbooks for you
Fundamentals Of Analytical Chemistry
Fundamentals Of Analytical Chemistry
Chemistry
ISBN:
9781285640686
Author:
Skoog
Publisher:
Cengage