An article in Electronic Components and Technology Conference (2002, Vol. 52, pp. 1167-1171) compared single versus dual spindle saw processes for copper metallized wafers. A total of 15 devices of each type were measured for the width of the backside chipouts, Xaingle = 66.385, saingle = 7.895and double = 45.278, Sdouble = 8.612. Use a = 0.05 and assume that both populations are normally distributed and have the same variance. (a) Do the sample data support the claim that both processes have the same mean width of backside chipouts? (b) Construct a 95% two-sided confidence interval on the mean difference in width of backside chipouts. SH, - Ha sl Round your answer to two decimal places (e.g. 98.76). (c) If the B-error of the test when the true difference in mean width of backside chipout measurements is 15 should not exceed 0.1, what sample sizes must be used? n = n = Round your answer to the nearest integer.
An article in Electronic Components and Technology Conference (2002, Vol. 52, pp. 1167-1171) compared single versus dual spindle saw processes for copper metallized wafers. A total of 15 devices of each type were measured for the width of the backside chipouts, Xaingle = 66.385, saingle = 7.895and double = 45.278, Sdouble = 8.612. Use a = 0.05 and assume that both populations are normally distributed and have the same variance. (a) Do the sample data support the claim that both processes have the same mean width of backside chipouts? (b) Construct a 95% two-sided confidence interval on the mean difference in width of backside chipouts. SH, - Ha sl Round your answer to two decimal places (e.g. 98.76). (c) If the B-error of the test when the true difference in mean width of backside chipout measurements is 15 should not exceed 0.1, what sample sizes must be used? n = n = Round your answer to the nearest integer.
Elementary Geometry For College Students, 7e
7th Edition
ISBN:9781337614085
Author:Alexander, Daniel C.; Koeberlein, Geralyn M.
Publisher:Alexander, Daniel C.; Koeberlein, Geralyn M.
Chapter9: Surfaces And Solids
Section9.1: Prisms, Area And Volume
Problem 13E: Generalize the results found in Exercise 11 and 12 by answering each of the following questions....
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Transcribed Image Text:An article in Electronic Components and Technology Conference (2002, Vol. 52, pp. 1167-1171) compared single versus dual spindle saw processes for copper metallized wafers. A total of 15 devices of each type were measured for the width
of the backside chipouts, Xaingle = 66.385, saingle = 7.895and double = 45.278, Sdouble = 8.612.
Use a = 0.05 and assume that both populations are normally distributed and have the same variance.
(a) Do the sample data support the claim that both processes have the same mean width of backside chipouts?
(b) Construct a 95% two-sided confidence interval on the mean difference in width of backside chipouts.
SH, - Ha sl
Round your answer to two decimal places (e.g. 98.76).
(c) If the B-error of the test when the true difference in mean width of backside chipout measurements is 15 should not exceed 0.1, what sample sizes must be used?
n = n =
Round your answer to the nearest integer.
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