In manufacturing integrated circuits, the yield of the manufacturing process is the percentage of good chips produced by the process. The probability that an integrated circuit manufactured by the Ace Electronics Company will be defective is p = 0.05. If a random sample of 15 circuits is selected for testing(use binomial distribution). Please show all your work.a) What is the probability that no more than one integrated circuit will be defective in the sample?b) What is the expected number of defective integrated circuits in the sample?
Compound Probability
Compound probability can be defined as the probability of the two events which are independent. It can be defined as the multiplication of the probability of two events that are not dependent.
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Probability theory is a branch of mathematics that deals with the subject of probability. Although there are many different concepts of probability, probability theory expresses the definition mathematically through a series of axioms. Usually, these axioms express probability in terms of a probability space, which assigns a measure with values ranging from 0 to 1 to a set of outcomes known as the sample space. An event is a subset of these outcomes that is described.
Conditional Probability
By definition, the term probability is expressed as a part of mathematics where the chance of an event that may either occur or not is evaluated and expressed in numerical terms. The range of the value within which probability can be expressed is between 0 and 1. The higher the chance of an event occurring, the closer is its value to be 1. If the probability of an event is 1, it means that the event will happen under all considered circumstances. Similarly, if the probability is exactly 0, then no matter the situation, the event will never occur.
In manufacturing
good chips produced by the process. The
Electronics Company will be defective is p = 0.05. If a random sample of 15 circuits is selected for testing
(use binomial distribution). Please show all your work.
a) What is the probability that no more than one integrated circuit will be defective in the sample?
b) What is the expected number of defective integrated circuits in the sample?
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