Below, two x-ray diffraction patterns obtained from two samples of the same material, but different crystal sizes are given. Which of the two (the top or the bottom one) has a smaller crystal size? On what feature of these XRD patterns are you basing your answer? Explain in detail how this feature of the XRD pattern indicates crystal size

Principles of Instrumental Analysis
7th Edition
ISBN:9781305577213
Author:Douglas A. Skoog, F. James Holler, Stanley R. Crouch
Publisher:Douglas A. Skoog, F. James Holler, Stanley R. Crouch
Chapter33: Automated Methods Of Analysis
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Problem 33.8QAP
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Below, two x-ray diffraction patterns obtained from two samples of the same material, but different crystal sizes are given. Which of the two (the top or the bottom one) has a smaller crystal size? On what feature of these XRD patterns are you basing your answer? Explain in detail how this feature of the XRD pattern indicates crystal size

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Transcribed Image Text:E X'Pert HighScore Plus - [YSB-5-900C-converted] A File Edit View Treatment Reference Patterns Analysis Reports Iools Customize Window Help Pos. [°2TH.): d-spacing [AJ: Counts: Lists Pane Pattern List Scan List Peak List Anchor Scan Data Quantification Object Inspector Accepted Pattern: Counts No. Visible Ref. Code Compound N.. Chemical Formula Score Scale. Semi.. YSB-5-900C-converted 2000 1000 - Candidates: No. Ref. Code t s. Compound Name Chemical Fo. Sca. Displa. ML NML| TL RIR Y203-B1203 400 - 300 - 200 – 100 10 20 30 40 50 60 Position [°2Theta] E Isolines 3D A 2D A Compare M Analyze E Pattern Additional Graphics Phase, few buttons 3 T y |ur器 並 9 Mail - alig. Materials . X'Pert Hig. D Windows . P3 Presentati. P Figures-27. w HW-1 - W. w Document. w Materials . w Document. w Buse-TR di. X wavelengt. X ysz 600-70.. OriginPro . 17:57 raw
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