Control charts for defectives and defects with sample size determined by np ≥ 3 and λ ≥ 3 are very cramped on the lower half of the charts. Design and validate a special run rule to detect out of control low events for these charts.

Automotive Technology: A Systems Approach (MindTap Course List)
6th Edition
ISBN:9781133612315
Author:Jack Erjavec, Rob Thompson
Publisher:Jack Erjavec, Rob Thompson
Chapter34: Emission Control Diagnosis And Service
Section: Chapter Questions
Problem 5RQ: Explain why the I/M 240 and similar tests are being replaced by the OBD II system test.
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Answer =Two Consecutive zeros on the chart, α = 0.0025

 
Control charts for defectives and defects with sample size determined by np ≥ 3 and λ ≥ 3 are very
cramped on the lower half of the charts. Design and validate a special run rule to detect out of control
low events for these charts.
Transcribed Image Text:Control charts for defectives and defects with sample size determined by np ≥ 3 and λ ≥ 3 are very cramped on the lower half of the charts. Design and validate a special run rule to detect out of control low events for these charts.
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