d) The following set of data, shown in Table Q4d, is the test results of times to failure for 15 electronic components (in days). Use the Kaplan Meier method to estimate the reliability distribution of these components. 8. 8+ 12+ 14 15+ 18 9 30 Table Q4d 8. 23+ 27+ 31 34+ 34+ 22
d) The following set of data, shown in Table Q4d, is the test results of times to failure for 15 electronic components (in days). Use the Kaplan Meier method to estimate the reliability distribution of these components. 8. 8+ 12+ 14 15+ 18 9 30 Table Q4d 8. 23+ 27+ 31 34+ 34+ 22
Holt Mcdougal Larson Pre-algebra: Student Edition 2012
1st Edition
ISBN:9780547587776
Author:HOLT MCDOUGAL
Publisher:HOLT MCDOUGAL
Chapter11: Data Analysis And Probability
Section: Chapter Questions
Problem 8CR
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