e fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 13 ectives. Calculate a 95% two-sided Cl on the fraction of defective circuits produced by this particular tool. Calculate a 95% upper confidence bound on the fraction of defective circuits.

Holt Mcdougal Larson Pre-algebra: Student Edition 2012
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ISBN:9780547587776
Author:HOLT MCDOUGAL
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Chapter11: Data Analysis And Probability
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(activity 1a) pls answer letter a and b
The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 13
defectives.
(a) Calculate a 95% two-sided Cl on the fraction of defective circuits produced by this particular tool.
(b) Calculate a 95% upper confidence bound on the fraction of defective circuits.
Transcribed Image Text:The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 13 defectives. (a) Calculate a 95% two-sided Cl on the fraction of defective circuits produced by this particular tool. (b) Calculate a 95% upper confidence bound on the fraction of defective circuits.
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