Table 2-2 Wafers Classified by Contamination and Location Number of Contamination Particles Center Edge Totals 0.30 0.10 0.40 0.15 0.05 0.20 0.10 0.05 0.15 0.06 0.04 0.10 0.04 0.01 0.05 007 003 010 34

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Table 2-2 Wafers Classified by Contamination and Location
Number of
Contamination
Particles
Center
Edge
Totals
0.30
0.10
0.40
0.15
0.05
0.20
0.10
0.05
0.15
3
0.06
0.04
0.10
4
0.04
0.01
0.05
5 or more
0.07
0.03
0.10
Totals
0.72
0.28
1.00
6) Consider the data on wafer contamination and
location in the sputtering tool shown in the Table.
Assume that one wafer is selected at random
from this set. Let A denote the event that a wafer
contains four or more particles, and let B denote
the event that a wafer is from the center of the
sputtering tool. Determine P(B).
7) Determine P(A/B).
8) Determine P(A N B).
Transcribed Image Text:Table 2-2 Wafers Classified by Contamination and Location Number of Contamination Particles Center Edge Totals 0.30 0.10 0.40 0.15 0.05 0.20 0.10 0.05 0.15 3 0.06 0.04 0.10 4 0.04 0.01 0.05 5 or more 0.07 0.03 0.10 Totals 0.72 0.28 1.00 6) Consider the data on wafer contamination and location in the sputtering tool shown in the Table. Assume that one wafer is selected at random from this set. Let A denote the event that a wafer contains four or more particles, and let B denote the event that a wafer is from the center of the sputtering tool. Determine P(B). 7) Determine P(A/B). 8) Determine P(A N B).
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