You deposit a sub-monolayer concentration of Cu colloid nanoparticles on a planar silicon wafer. You transfer the sample to a scanning electron microscope equipped with an energy dispersive detector (EDX) which is a bulk elemental x-ray method. After spending some time setting up the SEM conditions for EDX measurement you notice a predominantly strong Si peak, and an absence of Cu x-ray fluorescence signal. Explain why this happens, propose a solution
You deposit a sub-monolayer concentration of Cu colloid nanoparticles on a planar silicon wafer. You transfer the sample to a scanning electron microscope equipped with an energy dispersive detector (EDX) which is a bulk elemental x-ray method. After spending some time setting up the SEM conditions for EDX measurement you notice a predominantly strong Si peak, and an absence of Cu x-ray fluorescence signal. Explain why this happens, propose a solution
Chapter14: Chromatography
Section: Chapter Questions
Problem 9P
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