An experiment consists of testing two integrated circuits that come from the same silicon wafer, and observes each case whether a circuit is accepted (a) or rejected (r). Let A denote the event that the first chip tested is rejected and B denote the event that the second chip is rejected. Consider the a priori probability model P[rr] = 0.01, P[ra] = 0.01, P[ar] = 0.01, P[aa] = 0.97 Solve for the following: а. Р[A] b. Р[B] c. P[B|A] Ans. a. 0.02 b. 0.02. с. 0.5

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Please answer a,b, and C

An experiment consists of testing two integrated circuits that come from the
same silicon wafer, and observes each case whether a circuit is accepted (a)
or rejected (r). Let A denote the event that the first chip tested is rejected
and B denote the event that the second chip is rejected. Consider the a priori
probability model
P[rr] = 0.01, P[ra] = 0.01, P[ar] = 0.01, P[aa] = 0.97
Solve for the following:
a. P[A]
b. Р[B]
с. Р[B|A]
一一一個
Ans. a. 0.02
b. 0.02. с. 0.5
Transcribed Image Text:An experiment consists of testing two integrated circuits that come from the same silicon wafer, and observes each case whether a circuit is accepted (a) or rejected (r). Let A denote the event that the first chip tested is rejected and B denote the event that the second chip is rejected. Consider the a priori probability model P[rr] = 0.01, P[ra] = 0.01, P[ar] = 0.01, P[aa] = 0.97 Solve for the following: a. P[A] b. Р[B] с. Р[B|A] 一一一個 Ans. a. 0.02 b. 0.02. с. 0.5
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