Does the C2F6 flow rate affect average etch uniformity?  Use = 0.05. (b)  What is the P-value for the test in part (a)?

Appl Of Ms Excel In Analytical Chemistry
2nd Edition
ISBN:9781285686691
Author:Crouch
Publisher:Crouch
Chapter13: Kinetic Methods
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An article in Solid State Technology, "Orthogonal Design of Process Optimization and Its Application to Plasma Etching" by G.Z. Yin and D.W. Jillie (May, 1987) describes an experiment to determine the effect of C2F6 flow rate on the uniformity of the etch on a silicon wafer used in integrated circuit manufacturing.  Data for two flow rates are as follows:

C2F6

Uniformity Observation

(SCCM)

1

2

3

4

5

6

125

2.7

4.6

2.6

3.0

3.2

3.8

200

4.6

3.4

2.9

3.5

4.1

5.1

C2F6

Uniformity Observation

(SCCM)

1

2

3

4

5

6

125

2.7

4.6

2.6

3.0

3.2

3.8

200

4.6

3.4

2.9

3.5

4.1

5.1

(a)  Does the C2F6 flow rate affect average etch uniformity?  Use = 0.05.

(b)  What is the P-value for the test in part (a)? 

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