(i)Write the specific type of instrument as shown in figure 1.?(ii)How are the ions produced in the ionization chamber accelerated?(iii) What two properties of the ions determine how much they are deflected by the magneticfield?(iv) Why is it important that there is a vacuum in the instrument?StoragechamberGas inletManometerTo vacuumlonising´electronbeamCollectorResolving slitMolecular-leak lon source60°OscillographAccelerating -regionDC|amplifier uhlMassMagnetAnalyser tubespectrograph

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Answered: (i) Write the specific type of…

Principles of Instrumental Analysis

7th Edition

ISBN:9781305577213

Author:Douglas A. Skoog, F. James Holler, Stanley R. Crouch

Publisher:Douglas A. Skoog, F. James Holler, Stanley R. Crouch

Chapter1: Introduction

Section: Chapter Questions

Problem 1.9QAP

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5.4.5 Chemical microanalysis5.4.5.1 Exploitation of characteristic X-raysElectron probe microanalysis (EPMA) of bulk samples is now a routine technique for obtaining rapid, accurate analysis of alloys. A small electron probe (100 nm diameter) is used to generate X-rays from a defined area of a polished specimen and the intensity of the various characteristic X-rays measured usingeither wavelength-dispersive spectrometers (WDS) or energy-dispersive spectrometers (EDS). Typically the accuracy of the analysis is š0.1%. One of the limitations of EPMA of bulk samples is that the volume of the sample which contributes to the X-ray signal is relatively independent of the size of theelectron probe, because high-angle elastic scattering of electrons within the sample generates X-rays. The consequence of this is that the spatial resolution of EPMA is no better than ¾2 µm. In the last few years EDX detectors have been interfaced totransmission electron microscopes which are capable of operating…
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