measurements (in angstroms) on 20 subgroups of four substrates. (a) Set up F and R control charts on this process. Is the process in control? Revise the control limits as necessary. (b) Estimate the mean and standard deviation of the process. (c) Is the layer thickness normally distributed? (d) If the specifications are at 450 ± 30, estimate the orE conobility

Elementary Geometry For College Students, 7e
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ISBN:9781337614085
Author:Alexander, Daniel C.; Koeberlein, Geralyn M.
Publisher:Alexander, Daniel C.; Koeberlein, Geralyn M.
Chapter5: Similar Triangles
Section5.4: The Pythagorean Theorem
Problem 3E: Use theorem 5.4.3 to form a proportion in which RS is a geometric mean. Hint RVSRST Exercises 1-6
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- TABLE 6E.15
Additional Thickness Data for
Exercise 6.35.
Subgroup
X1 x2 x3 x4
21
454 449
443
461
22
449
441
444
455
23
442 442
442
450
24
443 452
438
430
25
446
459
457
457
26
454
448
445
462
27
458 449
453
438
28
450 449
445
451
29
443
440
443
451
30
457 450
452
437
measurements (in angstroms) on 20 subgroups of
four substrates.
(a) Set up ī and R control charts on this process. Is
the process in control? Revise the control limits
as necessary.
(b) Estimate the mean and standard deviation of the
process.
(c) Is the layer thickness normally distributed?
(d) If the specifications are at 450 + 30, estimate the
process capability.
Transcribed Image Text:- TABLE 6E.15 Additional Thickness Data for Exercise 6.35. Subgroup X1 x2 x3 x4 21 454 449 443 461 22 449 441 444 455 23 442 442 442 450 24 443 452 438 430 25 446 459 457 457 26 454 448 445 462 27 458 449 453 438 28 450 449 445 451 29 443 440 443 451 30 457 450 452 437 measurements (in angstroms) on 20 subgroups of four substrates. (a) Set up ī and R control charts on this process. Is the process in control? Revise the control limits as necessary. (b) Estimate the mean and standard deviation of the process. (c) Is the layer thickness normally distributed? (d) If the specifications are at 450 + 30, estimate the process capability.
6.34. A TIW layer is deposited on a substrate using a sput-
tering tool. Table 6E.14 contains layer thickness
- TABLE 6E.14
Layer Thickness Data for Exercise 6.34
Subgroup
Ir
459 449
435
450
443
440
442
442
3
457 444
449
444
4
469 463
453
438
5
443 457
445
454
444
456
456
457
7
445
449
450
445
8
446
455
449
452
9
444
452
457
440
10
432
463
463
443
11
445 452
453
438
12
456
457
436
457
13
459
445
441
447
14
441
465
438
450
15
460
453
457
438
16
453
444
451
435
17
451
460
450
457
18
422
431
437
429
19
444
446
448
467
20
450
450
454
454
Transcribed Image Text:6.34. A TIW layer is deposited on a substrate using a sput- tering tool. Table 6E.14 contains layer thickness - TABLE 6E.14 Layer Thickness Data for Exercise 6.34 Subgroup Ir 459 449 435 450 443 440 442 442 3 457 444 449 444 4 469 463 453 438 5 443 457 445 454 444 456 456 457 7 445 449 450 445 8 446 455 449 452 9 444 452 457 440 10 432 463 463 443 11 445 452 453 438 12 456 457 436 457 13 459 445 441 447 14 441 465 438 450 15 460 453 457 438 16 453 444 451 435 17 451 460 450 457 18 422 431 437 429 19 444 446 448 467 20 450 450 454 454
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