The part of SEM that is responsible for the production of electrons. * Electron guns Condenser lens Secondary detector Electron beam A surface analysis technique used for determining elemental composition on surfaces of solid samples. AFM SEM XRD SIMS XPS A surface analysis technique that uses a cantilever to scan over a region of interest. The cantilever deflects towards or away from the surface due to the attractive and repulsive forces with the sample.

The part of SEM that is responsible for the production of electrons. * Electron guns Condenser lens Secondary detector Electron beam A surface analysis technique used for determining elemental composition on surfaces of solid samples. AFM SEM XRD SIMS XPS A surface analysis technique that uses a cantilever to scan over a region of interest. The cantilever deflects towards or away from the surface due to the attractive and repulsive forces with the sample.

Principles of Instrumental Analysis

7th Edition

ISBN:9781305577213

Author:Douglas A. Skoog, F. James Holler, Stanley R. Crouch

Publisher:Douglas A. Skoog, F. James Holler, Stanley R. Crouch

Chapter7: Components Of Optical Instruments

Section: Chapter Questions

Problem 7.12QAP

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