Explain how XPS can be used to identify the compositions of the material in the layers below the surface. and state if is it possible to perform depth profile analysis using an X-ray tube such as Cu tube?

Principles of Instrumental Analysis
7th Edition
ISBN:9781305577213
Author:Douglas A. Skoog, F. James Holler, Stanley R. Crouch
Publisher:Douglas A. Skoog, F. James Holler, Stanley R. Crouch
Chapter21: Surface Characterization By Spectroscopy And Microscopy
Section: Chapter Questions
Problem 21.10QAP
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Explain how XPS can be used to identify the compositions of the material in the layers below the surface. and state if is it possible to perform depth profile analysis using an X-ray tube such as Cu tube? 

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