an X-ray diffraction pattern for a powder sample of Cr (crystal system: body-centered cubic and lattice parameter a = 0.2884 nm) is measured using a conventional diffractometer. For the (220) plane, compute the Lorentz-polarization factor (LP) using CuKα radiation λ = 0.1542 nm.
an X-ray diffraction pattern for a powder sample of Cr (crystal system: body-centered cubic and lattice parameter a = 0.2884 nm) is measured using a conventional diffractometer. For the (220) plane, compute the Lorentz-polarization factor (LP) using CuKα radiation λ = 0.1542 nm.
Principles of Instrumental Analysis
7th Edition
ISBN:9781305577213
Author:Douglas A. Skoog, F. James Holler, Stanley R. Crouch
Publisher:Douglas A. Skoog, F. James Holler, Stanley R. Crouch
Chapter7: Components Of Optical Instruments
Section: Chapter Questions
Problem 7.12QAP
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an X-ray diffraction pattern for a powder sample of Cr (crystal system: body-centered cubic and lattice parameter a = 0.2884 nm) is measured using a conventional diffractometer. For the (220) plane, compute the Lorentz-polarization factor (LP) using CuKα radiation λ = 0.1542 nm.
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