Which of the following is NOT true? Select one: a.SEM is used to analyze the chemical composition, structure, and shape of nanoscale materials. b.SEM can resolve features both inside and outside the focal plane. c.SEM magnification and resolution is limited by diffraction. d.SEM uses an electron beam rather than light.

Which of the following is NOT true? Select one: a.SEM is used to analyze the chemical composition, structure, and shape of nanoscale materials. b.SEM can resolve features both inside and outside the focal plane. c.SEM magnification and resolution is limited by diffraction. d.SEM uses an electron beam rather than light.

Principles of Instrumental Analysis

7th Edition

ISBN:9781305577213

Author:Douglas A. Skoog, F. James Holler, Stanley R. Crouch

Publisher:Douglas A. Skoog, F. James Holler, Stanley R. Crouch

Chapter16: An Introduction To Infrared Spectrometry

Section: Chapter Questions

Problem 16.13QAP: The first FTIR instruments used three different interferometer systems. Briefly, describe how it has...

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