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The time to failure in hours of an electronic component subjected to an accelerated life test is shown in Table 4E.1. To accelerate the failure test, the units were tested an elevated temperature (read down, then across). Is the data normally distributed? Provide your reasoning, you may attach supporting files as necessary. Table 4E.1 Electronic Component Failure Time 127 124 121 118 125 123 136 131 131 120 140 125 124 119 137 133 129 128 125 141 121 133 124 125 142 137 128 140 151 124 129 131 160 142 130 129 125 123 122 126

The time to failure in hours of an electronic component subjected to an accelerated life test is shown in Table 4E.1. To accelerate the failure test, the units were tested an elevated temperature (read down, then across). Is the data normally distributed? Provide your reasoning, you may attach supporting files as necessary. Table 4E.1 Electronic Component Failure Time 127 124 121 118 125 123 136 131 131 120 140 125 124 119 137 133 129 128 125 141 121 133 124 125 142 137 128 140 151 124 129 131 160 142 130 129 125 123 122 126

Glencoe Algebra 1, Student Edition, 9780079039897, 0079039898, 2018
Glencoe Algebra 1, Student Edition, 9780079039897, 0079039898, 2018
18th Edition
ISBN:9780079039897
Author:Carter
Publisher:Carter
Chapter10: Statistics
Section10.5: Comparing Sets Of Data
Problem 13PPS
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The time to failure in hours of an electronic component subjected to an accelerated life test is shown in Table 4E.1. To accelerate the failure test, the units were tested at an elevated temperature (read down, then across). Is the data normally distributed? Provide your reasoning, you may attach supporting files as necessary. Table 4E.1 Electronic Component Failure Time 127 124 121 118 125 123 136 131 131 120 140 125 124 119 137 133 129 128 125 141 121 133 124 125 142 137 128 140 151 124 129 131 160 142 130 129 125 123 122 126
Transcribed Image Text:The time to failure in hours of an electronic component subjected to an accelerated life test is shown in Table 4E.1. To accelerate the failure test, the units were tested at an elevated temperature (read down, then across). Is the data normally distributed? Provide your reasoning, you may attach supporting files as necessary. Table 4E.1 Electronic Component Failure Time 127 124 121 118 125 123 136 131 131 120 140 125 124 119 137 133 129 128 125 141 121 133 124 125 142 137 128 140 151 124 129 131 160 142 130 129 125 123 122 126
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