In a diffractometer, X-rays with a wavelength of 0.213 nm were used to produce a diffraction pattern for nickel. The second order diffraction occurred at an angle = 44.21°. Find the spacing between the diffracting planes in nickel.

Chemistry by OpenStax (2015-05-04)
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Author:Klaus Theopold, Richard H Langley, Paul Flowers, William R. Robinson, Mark Blaser
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Chapter10: Liquids And Solids
Section: Chapter Questions
Problem 102E: A diffracrometer using X-rays with a wavelength of 0.2287 nm produced first-order diffraction peak...
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In a diffractometer, X-rays with a wavelength of 0.213 nm were used to
produce a diffraction pattern for nickel. The second order diffraction
occurred at an angle 0 = 44.21°. Find the spacing between the diffracting
planes in nickel.
Transcribed Image Text:In a diffractometer, X-rays with a wavelength of 0.213 nm were used to produce a diffraction pattern for nickel. The second order diffraction occurred at an angle 0 = 44.21°. Find the spacing between the diffracting planes in nickel.
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