The number of contaminating particles on a silicon waferprior to a certain rinsing process was determined for eachwafer in a sample of size 100, resulting in the followingfrequencies:Number of particles 0 1 2 3 4 5 6 7Frequency 1 2 3 12 11 15 18 10Number of particles 8 9 10 11 12 13 14Frequency 12 4 5 3 1 2 1a. What proportion of the sampled wafers had at leastone particle? At least five particles?b. What proportion of the sampled wafers had betweenfive and ten particles, inclusive? Strictly between fiveand ten particles?c. Draw a histogram using relative frequency on thevertical axis. How would you describe the shape of thehistogram?

Mathematics For Machine Technology
8th Edition
ISBN:9781337798310
Author:Peterson, John.
Publisher:Peterson, John.
Chapter29: Tolerance, Clearance, And Interference
Section: Chapter Questions
Problem 16A: Spacers are manufactured to the mean dimension and tolerance shown in Figure 29-12. An inspector...
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The number of contaminating particles on a silicon wafer
prior to a certain rinsing process was determined for each
wafer in a sample of size 100, resulting in the following
frequencies:
Number of particles 0 1 2 3 4 5 6 7
Frequency 1 2 3 12 11 15 18 10
Number of particles 8 9 10 11 12 13 14
Frequency 12 4 5 3 1 2 1
a. What proportion of the sampled wafers had at least
one particle? At least five particles?
b. What proportion of the sampled wafers had between
five and ten particles, inclusive? Strictly between five
and ten particles?
c. Draw a histogram using relative frequency on the
vertical axis. How would you describe the shape of the
histogram?

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ISBN:
9781337798310
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Peterson, John.
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Cengage Learning,