NanoSIMS instruments (secondary ion mass spectrometry) are used to analyze single cells. It consists of Cs + and O 2 as primary beam sources. NanoSIMS is equipped with 50 nm resolution and 200 nm resolution for Cs + and O 2 beam, respectively. The generation of positive secondary ions by O 2 beam is used to analyze Fe, Na, and Mg (metals). The generation of negative secondary ions by Cs + beam is used to analyze cellular elements (for example, N, P, S, O, C, and H) and halogens.

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Chapter 18, Problem 16RQ

Summary Introduction

NanoSIMS instruments (secondary ion mass spectrometry) are used to analyze single cells. It consists of Cs⁺ and O₂ as primary beam sources. NanoSIMS is equipped with 50 nm resolution and 200 nm resolution for Cs⁺ and O₂ beam, respectively. The generation of positive secondary ions by O₂ beam is used to analyze Fe, Na, and Mg (metals). The generation of negative secondary ions by Cs⁺ beam is used to analyze cellular elements (for example, N, P, S, O, C, and H) and halogens.

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Answer 2

Question

Chapter 18, Problem 16RQ

Summary Introduction

NanoSIMS instruments (secondary ion mass spectrometry) are used to analyze single cells. It consists of Cs⁺ and O₂ as primary beam sources. NanoSIMS is equipped with 50 nm resolution and 200 nm resolution for Cs⁺ and O₂ beam, respectively. The generation of positive secondary ions by O₂ beam is used to analyze Fe, Na, and Mg (metals). The generation of negative secondary ions by Cs⁺ beam is used to analyze cellular elements (for example, N, P, S, O, C, and H) and halogens.

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Answer 3

Question

Chapter 18, Problem 16RQ

Summary Introduction

NanoSIMS instruments (secondary ion mass spectrometry) are used to analyze single cells. It consists of Cs⁺ and O₂ as primary beam sources. NanoSIMS is equipped with 50 nm resolution and 200 nm resolution for Cs⁺ and O₂ beam, respectively. The generation of positive secondary ions by O₂ beam is used to analyze Fe, Na, and Mg (metals). The generation of negative secondary ions by Cs⁺ beam is used to analyze cellular elements (for example, N, P, S, O, C, and H) and halogens.

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Answer 4

Question

Chapter 18, Problem 16RQ

Summary Introduction

NanoSIMS instruments (secondary ion mass spectrometry) are used to analyze single cells. It consists of Cs⁺ and O₂ as primary beam sources. NanoSIMS is equipped with 50 nm resolution and 200 nm resolution for Cs⁺ and O₂ beam, respectively. The generation of positive secondary ions by O₂ beam is used to analyze Fe, Na, and Mg (metals). The generation of negative secondary ions by Cs⁺ beam is used to analyze cellular elements (for example, N, P, S, O, C, and H) and halogens.

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Answer 5

Chapter 18, Problem 16RQ

Summary Introduction

NanoSIMS instruments (secondary ion mass spectrometry) are used to analyze single cells. It consists of Cs⁺ and O₂ as primary beam sources. NanoSIMS is equipped with 50 nm resolution and 200 nm resolution for Cs⁺ and O₂ beam, respectively. The generation of positive secondary ions by O₂ beam is used to analyze Fe, Na, and Mg (metals). The generation of negative secondary ions by Cs⁺ beam is used to analyze cellular elements (for example, N, P, S, O, C, and H) and halogens.

Answer 6

Chapter 18, Problem 16RQ

Summary Introduction

NanoSIMS instruments (secondary ion mass spectrometry) are used to analyze single cells. It consists of Cs⁺ and O₂ as primary beam sources. NanoSIMS is equipped with 50 nm resolution and 200 nm resolution for Cs⁺ and O₂ beam, respectively. The generation of positive secondary ions by O₂ beam is used to analyze Fe, Na, and Mg (metals). The generation of negative secondary ions by Cs⁺ beam is used to analyze cellular elements (for example, N, P, S, O, C, and H) and halogens.

Answer 7

Chapter 18, Problem 16RQ

Summary Introduction

NanoSIMS instruments (secondary ion mass spectrometry) are used to analyze single cells. It consists of Cs⁺ and O₂ as primary beam sources. NanoSIMS is equipped with 50 nm resolution and 200 nm resolution for Cs⁺ and O₂ beam, respectively. The generation of positive secondary ions by O₂ beam is used to analyze Fe, Na, and Mg (metals). The generation of negative secondary ions by Cs⁺ beam is used to analyze cellular elements (for example, N, P, S, O, C, and H) and halogens.

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