(a) Use these data to set up a control chart on oxide thickness and a moving range chart. Does the process exhibit statistical control?

Mathematics For Machine Technology
8th Edition
ISBN:9781337798310
Author:Peterson, John.
Publisher:Peterson, John.
Chapter29: Tolerance, Clearance, And Interference
Section: Chapter Questions
Problem 16A: Spacers are manufactured to the mean dimension and tolerance shown in Figure 29-12. An inspector...
icon
Related questions
icon
Concept explainers
Question

Q4)

4. Thirty observations on the oxide thickness of individual silicon wafers are shown in below table.
Oxide
Oxide
Wafer Thickness
Wafer
Thickness
1
47.4
16
57.6
2
48.6
17
51.0
3
45.5
18
43.2
4
44.0
19
47.1
5
50.9
20
45.7
53.2
21
60.6
7
45.6
22
51.0
8
52.8
23
53.0
45.3
24
59.0
10
46.3
25
47.2
11
49.9
26
49.0
12
47.8
27
55.9
13
46.9
28
52.0
14
48.8
29
47.9
15
45.1
30
53.4
Transcribed Image Text:4. Thirty observations on the oxide thickness of individual silicon wafers are shown in below table. Oxide Oxide Wafer Thickness Wafer Thickness 1 47.4 16 57.6 2 48.6 17 51.0 3 45.5 18 43.2 4 44.0 19 47.1 5 50.9 20 45.7 53.2 21 60.6 7 45.6 22 51.0 8 52.8 23 53.0 45.3 24 59.0 10 46.3 25 47.2 11 49.9 26 49.0 12 47.8 27 55.9 13 46.9 28 52.0 14 48.8 29 47.9 15 45.1 30 53.4
(a) Use these data to set up a control chart on oxide thickness and a moving range chart. Does
the process exhibit statistical control?
Following the establishment of the control charts, ten new wafers were observed. The oxide
thickness measurements are as follows:
Oxide
Oxide
Wafer Thickness
Wafer
Thickness
1
54.3
51.5
2
57.5
7
58.4
3
64.8
8
67.5
4
62.1
61.1
5
59.6
10
63.3
(b) Plot these observations against the control limits in part (a). Is the process in control?
Transcribed Image Text:(a) Use these data to set up a control chart on oxide thickness and a moving range chart. Does the process exhibit statistical control? Following the establishment of the control charts, ten new wafers were observed. The oxide thickness measurements are as follows: Oxide Oxide Wafer Thickness Wafer Thickness 1 54.3 51.5 2 57.5 7 58.4 3 64.8 8 67.5 4 62.1 61.1 5 59.6 10 63.3 (b) Plot these observations against the control limits in part (a). Is the process in control?
Expert Solution
trending now

Trending now

This is a popular solution!

steps

Step by step

Solved in 5 steps with 4 images

Blurred answer
Knowledge Booster
Points, Lines and Planes
Learn more about
Need a deep-dive on the concept behind this application? Look no further. Learn more about this topic, statistics and related others by exploring similar questions and additional content below.
Similar questions
  • SEE MORE QUESTIONS
Recommended textbooks for you
Mathematics For Machine Technology
Mathematics For Machine Technology
Advanced Math
ISBN:
9781337798310
Author:
Peterson, John.
Publisher:
Cengage Learning,