OPERATIONS MANAGMENT IN...-ACCESS
OPERATIONS MANAGMENT IN...-ACCESS
7th Edition
ISBN: 9781259716225
Author: SCHROEDER
Publisher: MCG
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Chapter 9, Problem 14P

a)

Summary Introduction

To determine: The standard deviation of the process.

Introduction:

Process capability:

Process capability is the measure of repeatability of a process over and over with consistency in the manufacturing, relative to the requirements asked by the customer.

b)

Summary Introduction

To determine: The process mean value.

c)

Summary Introduction

To explain: The possible actions for the company if it cannot meet the requirements.

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A customer has specified that they require a process capability of Cp= 1.5 for a certain product. Assume that USL = 1100, LSL = 700, and the process is centered within the specification range. a. What standard deviation should the process have? b. What is the process mean value? c. What can the company do if it is not capable of meeting these requirements?
A process is in statistical control with = 202,5 y s = 2,0. Specifications are atLSL = 196 and USL = 206.a) Estimate the process capability with an appropriate process capability ratio.b) What is the potential capability of this process?c) Items that are produced below the lower specification limit must bescrapped, while items that are above the upper specification limit can bereworked. What proportion of the process output is scrap and whatproportion is rework?d) Because scrap is more expensive than rework, the process has been centered closer to the upper specification limit. If scrap is twice as expensive as rework, is the process mean at the best possible location? What value of the process target would you recommend?
Flextronchip, an OEM manufacturer, has a fifth-generation chip for cell phones, with chip specification of 0.2 ± 0.0002 mm for the distance between two adjacent pins. The loss due to a defective chip has been estimated as $28.   Required: 1. Compute the value of k, the cost coefficient in the Taguchi quality loss function (QLF), L(x) = k(x − T)2. 2. Assume that the quality control manager takes a sample of 100 chips from the production process. The results are as follows:   Measurement Frequency 0.1996 2 0.1997 6 0.1998 14 0.1999 9 0.2000 45 0.2001 9 0.2002 8 0.2003 5 0.2004 2   a. & b. Use the appropriate Taguchi quality loss function, L(x), to calculate the estimated quality loss for each of the observed measurements. Additionally, calculate the expected (i.e., average) loss per unit for the production process as a whole.
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