I need the answer as soon as possible 9:YE IZAOEMO ".llCalculate the drift current density in (mA/m?) for the silicon at roomtemperature. If the intrinsic carrier concentration of (2x1016electron/m?) wviththe doping concentration of (3x101őatoms/m) of the phosphorus and(2x1016atoms/m) of Boron. Given the mobility for the electrons (0.15m?/V.s)and the mobility for the holes (0.05m?/V.s) and the electric field (100V/m).85.7582.7780.7772.7262.77Determine the range of values for the input voltage that will keep the valueof the load voltage constant at 20V if IzM-80mARs2002+ViRL IkaV.20V, 36V24V, 30V24V, 40V24V, 36VO 20V, 40V

As per company guidelines we are supposed to answer only one question. Kindly repost other questions…

Answered: Calculate the drift current density in…

Introductory Circuit Analysis (13th Edition)

13th Edition

ISBN:9780133923605

Author:Robert L. Boylestad

Publisher:Robert L. Boylestad

Chapter1: Introduction

Section: Chapter Questions

Problem 1P: Visit your local library (at school or home) and describe the extent to which it provides literature...

See similar textbooks

Similar questions

You are given an intrinsic silicon at "some" temperature. Assume that the intrinsic Fermi level, E, is exactly at the middle of the of the conduction band edge, Ec, and the valence band edge, Ev. It is known that the Fermi-Dirac probability for electrons at the conduction band edge is fe(E) = 5×102 at the unknown temperature. 1.What is the Fermi-Dirac probability for electrons at the intrinsic Fermi level, fe(Ei)?
Calculate the drift current in silicon at room temperature. If the intrinsic carrier concentration of (1×1016electron/m³) with the doping concentration of (2×1016atoms/m³) of the phosphorus and (1×1016atoms/m³) of Boron. Given the mobility for the electrons (0.15m2/V.s), the mobility for the holes (0.05m2/V.s), the electric field (100V/m), and the cross section area is 1mm?.
You are given an intrinsic silicon at "some" temperature. Assume that the intrinsic Fermi level, E, is exactly at the middle of the of the conduction band edge, Ec, and the valence band edge, Ev. It is known that the Fermi-Dirac probability for electrons at the conduction band edge is fe(E) = 5×102 at the unknown temperature. 1. What is the probability to find holes fh(Ec) at the conduction band edge?2. What is the Fermi-Dirac probability for electrons at the valence band edge, fe(Ev)?3. What is the Fermi-Dirac probability for holes at the valence band edge, fh(Ev)?
A diffused silicon PN junction has a linearly graded junction in the P-side with ?=10^19cm−3, and a uniform doping of 3×10^14 cm−3on the N-side. If the depletion layer width of the P-side is 0.8μm at zero bias, find the total depletion layer width, built-in potential, maximum field at zero bias and sketch the potential distribution.
A 100Ω resistor is to be made at room temperature in arectangular silicon bar of 1 cm in length and 1mm 2 in cross sectionalarea by doping it appropriately with phosphorous atoms. If theelectron mobility in silicon at room temperature be 1350 cm 2 /V-second. Calculate the dopant density needed to achieve this. Neglectthe insignificant contribution by the intrinsic carriers.
Assume D = D0e^–Ea/kT is the diffusion coefficient of boron in silicon surface, whereD0 = 10.5 cm^2/s and Ea = 3.7 eV. The substrate is N-type silicon doped to 10^15 cm^3.N0 = 10^15 cm^2 of boron is introduced just below the silicon surface.(a) What is the junction depth after a 1-h drive-in at 1,100°C?(b) By how much will the junction depth change after 10^6 h (~100 years) of operation at100°C
Estimate the amount of free electrons and holes in a N-doped Silicon wafer a) at room temperature with 1014 cm-3 doping level, and b) at 650K with 1015 cm-3 doping level
A silicon sample is supporting an electric ﬁeld of −1500 V/cm, and the mobilities of electrons and holes are 1000 and 400 cm2/V·s, respectively. What are the electron and hole velocities? If p=1017/cm3 and n=103/cm3, what are the electron and hole current densities?
(a) Calculate the indium content of an InGaAs ternary compound semiconductor using a linear approximation, which would have a bandgap of 1.155 eV knowing that a bandgap (EG InAs) of InAs is 0.354 eV and a bandgap (EG GaAs) of GaAs is 1.424 eV. (b) Calculate the effective electron mass of the InGaAs ternary compound semiconductor using a linear approximation with an indium content from question (a). Use a relative electron effective mass of InAs of 0.031 and of GaAs of 0.0665.
The carrier mobility of an organic semiconductor layer can be measured by the time-of-flight (TOF) photoconductivity measurement. Fig.1(a) is a schematic diagram of the TOF set-up, and Fig.1 (b) is the typical TOF transient measured for a 10 μm thick NPB film sandwiched between an ultrathin Al cathode and an ITO anode. From the constant current plateau in the TOF measurement, as shown in Fig.1(b), the transit time thus obtained for the NPB sample is 9 μs. (a) Calculate the carrier mobility in NPB layer. (b) Explain what type of the carriers, i.e., hole or electron mobility, was measured in the experiment.
A silicon sample at room temperature is doped with gallium (Ga) from one side such that Ndoping=38.85x1015e−x/α , α = 0.5 µm, and Ndoping >> ni. Calculate the electric field at x= 1µm.
3. at ??? = 10mA. Determine also the diode dynamic resistance at ??? = 10mA, and compare it with the theoretical value obtained from the equation

SEE MORE QUESTIONS

Recommended textbooks for you

Introductory Circuit Analysis (13th Edition)

Electrical Engineering

ISBN:

9780133923605

Author:

Robert L. Boylestad

Publisher:

PEARSON

Delmar's Standard Textbook Of Electricity

Electrical Engineering

ISBN:

9781337900348

Author:

Stephen L. Herman

Publisher:

Cengage Learning

Programmable Logic Controllers

Electrical Engineering

ISBN:

9780073373843

Author:

Frank D. Petruzella

Publisher:

McGraw-Hill Education

Introductory Circuit Analysis (13th Edition)

Electrical Engineering

ISBN:

9780133923605

Author:

Robert L. Boylestad

Publisher:

PEARSON

Delmar's Standard Textbook Of Electricity

Electrical Engineering

ISBN:

9781337900348

Author:

Stephen L. Herman

Publisher:

Cengage Learning

Programmable Logic Controllers

Electrical Engineering

ISBN:

9780073373843

Author:

Frank D. Petruzella

Publisher:

McGraw-Hill Education

Fundamentals of Electric Circuits

Electrical Engineering

ISBN:

9780078028229

Author:

Charles K Alexander, Matthew Sadiku

Publisher:

McGraw-Hill Education

Electric Circuits. (11th Edition)

Electrical Engineering

ISBN:

9780134746968

Author:

James W. Nilsson, Susan Riedel

Publisher:

PEARSON

Engineering Electromagnetics

Electrical Engineering

ISBN:

9780078028151

Author:

Hayt, William H. (william Hart), Jr, BUCK, John A.

Publisher:

Mcgraw-hill Education,

SEE MORE TEXTBOOKS