Consider the circuit in Figure 6.18. The circuit parameters are V + = 3.3 V , V B B = 2.455 V , R B = 80 kΩ , and R C = 7 kΩ . The transistor parameters are β = 110 , V B E (on) = 0.7 V , and V A = 80 V . (a) Determine I C Q and V E C Q . (b) Find g m , r π , and r o . (c) Determine the small−signal voltage gain A υ = υ o / υ s . (d) Find the small−signal input and output resistances R i and R o , respectively. (Ans. (a) I C Q =0 .2mA , V E C Q = 1.9 V ; (b) g m = 7.692 mA/V , r π = 14.3 kΩ , r o = 400 kΩ ; (c) A υ = − 8.02 ; (d) R i = 94.3 kΩ , R o = 6.88 kΩ )
Consider the circuit in Figure 6.18. The circuit parameters are V + = 3.3 V , V B B = 2.455 V , R B = 80 kΩ , and R C = 7 kΩ . The transistor parameters are β = 110 , V B E (on) = 0.7 V , and V A = 80 V . (a) Determine I C Q and V E C Q . (b) Find g m , r π , and r o . (c) Determine the small−signal voltage gain A υ = υ o / υ s . (d) Find the small−signal input and output resistances R i and R o , respectively. (Ans. (a) I C Q =0 .2mA , V E C Q = 1.9 V ; (b) g m = 7.692 mA/V , r π = 14.3 kΩ , r o = 400 kΩ ; (c) A υ = − 8.02 ; (d) R i = 94.3 kΩ , R o = 6.88 kΩ )
Solution Summary: The circuit for pnp common emitter is shown in Figure 1.
Consider the circuit in Figure 6.18. The circuit parameters are
V
+
=
3.3
V
,
V
B
B
=
2.455
V
,
R
B
=
80
kΩ
, and
R
C
=
7
kΩ
. The transistor parameters are
β
=
110
,
V
B
E
(on)
=
0.7
V
, and
V
A
=
80
V
. (a) Determine
I
C
Q
and
V
E
C
Q
. (b) Find
g
m
,
r
π
, and
r
o
. (c) Determine the small−signal voltage gain
A
υ
=
υ
o
/
υ
s
. (d) Find the small−signal input and output resistances
R
i
and
R
o
, respectively. (Ans. (a)
I
C
Q
=0
.2mA
,
V
E
C
Q
=
1.9
V
; (b)
g
m
=
7.692
mA/V
,
r
π
=
14.3
kΩ
,
r
o
=
400
kΩ
; (c)
A
υ
=
−
8.02
; (d)
R
i
=
94.3
kΩ
,
R
o
=
6.88
kΩ
)
Complete the phrase! The error of a measurement system depends on the non-ideal characteristics of every element in the system. Using calibration techniques we can identify which element in the system have the most dominant non-ideal behavior. We can than devise compensation strategies for t6hese elements which should produce significant reductions in the overall system error. The methods are named .....
Subject : ELECTRONIC CIRCUIT ANALYSIS AND DEVICES
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