Production and Operations Analysis, Seventh Edition
7th Edition
ISBN: 9781478623069
Author: Steven Nahmias, Tava Lennon Olsen
Publisher: Waveland Press, Inc.
expand_more
expand_more
format_list_bulleted
Concept explainers
Question
Chapter 12.11, Problem 42P
Summary Introduction
Interpretation: Graph needs to be plotted based on sequential sampling technique with the help of given data.
Concept Introduction: Sequential Sampling technique helps a researcher to conduct experiments again even after accepting the null hypothesis.
Expert Solution & Answer
Want to see the full answer?
Check out a sample textbook solutionStudents have asked these similar questions
A single sampling inspection scheme for large lot of mass-produced flanges states:From each lot take and inspect a random sample of 50. If 3 or more defectives, inspect the whole lot and remove all defectives, if less than 3 are found accept the lot without further inspection.a. Obtain the equation for Pa the probability that a lot containing a fraction p of defectives will be accepted, in terms of p.b. Evaluate Pa for p=0.01, 0.02, 0.03, 0.05, 0.07, 0.10, 0.15, 0.20, 0.30. Plotthe operating characteristics and average outgoing quality curve.c. Estimate: (a) the producer’s Risk at p of 2% (b) the consumer’s Risk for pof 5%.
A company employs the following sampling plan: It draws a sample of 10 percentof the lot being inspected. If 1 percent or less of the sample is defective, the lot isaccepted. Otherwise the lot is rejected. c. If a lot contains 10,000 items of which 200 are defective, what is the probability that the lot is accepted?
A company employs the following sampling plan: It draws a sample of 10 percentof the lot being inspected. If 1 percent or less of the sample is defective, the lot isaccepted. Otherwise the lot is rejected.b. If a lot contains 1,000 items of which 20 are defective, what is the probabilitythat the lot is accepted?
Chapter 12 Solutions
Production and Operations Analysis, Seventh Edition
Ch. 12.1 - Prob. 2PCh. 12.1 - Prob. 3PCh. 12.1 - Prob. 4PCh. 12.1 - Prob. 5PCh. 12.1 - Prob. 6PCh. 12.2 - Prob. 7PCh. 12.2 - Prob. 8PCh. 12.2 - Prob. 9PCh. 12.2 - Prob. 10PCh. 12.2 - Prob. 11P
Ch. 12.2 - Prob. 12PCh. 12.2 - Prob. 13PCh. 12.3 - Prob. 14PCh. 12.3 - Prob. 15PCh. 12.3 - Prob. 16PCh. 12.3 - Prob. 17PCh. 12.4 - Prob. 18PCh. 12.4 - Prob. 19PCh. 12.4 - Prob. 20PCh. 12.4 - Prob. 21PCh. 12.5 - Prob. 22PCh. 12.6 - Prob. 23PCh. 12.6 - Prob. 24PCh. 12.6 - Prob. 25PCh. 12.6 - Prob. 26PCh. 12.6 - Prob. 27PCh. 12.6 - Prob. 28PCh. 12.9 - Prob. 29PCh. 12.9 - Prob. 30PCh. 12.9 - Prob. 31PCh. 12.9 - Prob. 32PCh. 12.9 - Prob. 33PCh. 12.10 - Prob. 34PCh. 12.10 - Prob. 35PCh. 12.10 - Prob. 37PCh. 12.10 - Prob. 38PCh. 12.10 - Prob. 39PCh. 12.10 - Prob. 40PCh. 12.11 - Prob. 41PCh. 12.11 - Prob. 42PCh. 12.11 - Prob. 43PCh. 12.11 - Prob. 44PCh. 12.12 - Prob. 46PCh. 12.12 - Prob. 47PCh. 12.12 - Prob. 48PCh. 12 - Prob. 49APCh. 12 - Prob. 50APCh. 12 - Prob. 51APCh. 12 - Prob. 52APCh. 12 - Prob. 53APCh. 12 - Prob. 54APCh. 12 - Prob. 55APCh. 12 - Prob. 57APCh. 12 - Prob. 58APCh. 12 - Prob. 59APCh. 12 - Prob. 60APCh. 12 - Prob. 61APCh. 12 - Prob. 62APCh. 12 - Prob. 63APCh. 12 - Prob. 64APCh. 12 - Prob. 65APCh. 12 - Prob. 66APCh. 12 - Prob. 67APCh. 12 - Prob. 68APCh. 12 - Prob. 69APCh. 12 - Prob. 70AP
Knowledge Booster
Learn more about
Need a deep-dive on the concept behind this application? Look no further. Learn more about this topic, operations-management and related others by exploring similar questions and additional content below.Similar questions
- Consider the double sampling plan for Spire CDs described in this section. Over aperiod of one year, 3,860 boxes of records are subject to inspection using this plan.If 60 percent of these batches are “good” (that is, in 60 percent of the batches theproportion of defectives is exactly 10 percent) and 40 percent are “bad” (that is, in40 percent of the batches the proportion of defectives is exactly 30 percent), thenwhat is the expected number of batchesa. Accepted?arrow_forwardConsider the double sampling plan for Spire CDs described in this section. Over aperiod of one year, 3,860 boxes of records are subject to inspection using this plan.If 60 percent of these batches are “good” (that is, in 60 percent of the batches theproportion of defectives is exactly 10 percent) and 40 percent are “bad” (that is, in40 percent of the batches the proportion of defectives is exactly 30 percent), thenwhat is the expected number of batchesd. Accepted on the second sample?arrow_forwardConsider the double sampling plan for Spire CDs described in this section. Over aperiod of one year, 3,860 boxes of records are subject to inspection using this plan.If 60 percent of these batches are “good” (that is, in 60 percent of the batches theproportion of defectives is exactly 10 percent) and 40 percent are “bad” (that is, in40 percent of the batches the proportion of defectives is exactly 30 percent), thenwhat is the expected number of batchese. Rejected on the first sample?arrow_forward
- Consider the double sampling plan for Spire CDs described in this section. Over aperiod of one year, 3,860 boxes of records are subject to inspection using this plan.If 60 percent of these batches are “good” (that is, in 60 percent of the batches theproportion of defectives is exactly 10 percent) and 40 percent are “bad” (that is, in40 percent of the batches the proportion of defectives is exactly 30 percent), thenwhat is the expected number of batchesf. Rejected on the second sample?arrow_forwardConsider the following double sampling plan. First select a sample of 5 from a lotof 100. If there are four or more defectives in the sample, reject the lot. If there isone or fewer defective, accept the lot. If there are two or three defectives, samplean additional five items and reject the lot if the combined number of defectives inboth samples is five or more. If the lot has 10 defectives, what is the probabilitythat a lot passes the inspection? For the double sampling plan described in Problem 39, determine the following:b. The probability that the lot is rejected based on the second sample.arrow_forwardC-Spec, Inc., is attempting to determine whether an existing machine is capable of milling an engine part that has a key specification of 4 ± .003 inches. After a trial run on this machine, C-Spec has determined that the machine has a sample mean of 4.001 inches witha standard deviation of .002 inch. (Answer in Appendix D)a. Calculate the Cpk for this machine.b. Should C-Spec use this machine to produce this part? Why?arrow_forward
- Which of the following statements about Pareto diagrams is correct?a. The Pareto diagram shows the possible root causes of a problem along with the numberof defect occurrences.b. The Pareto diagram shows the process capability index over time.c. The Pareto diagram shows the mean of a random sample at various points in time.d. The Pareto diagram shows a visual representation of binary outcome variables.arrow_forwardDesign the Single Sampling Plan (SSP) that will accept 95% of the lots containing 2% defective parts and will accept only 5% of the lots containing 9% defective parts.arrow_forwardSamples of size 20 are drawn from lots of 100 items, and the lots are rejected if thenumber of defectives in the sample exceeds 2. If the true proportion of defectives inthe lot is 5 percent, determine the probability that a lot is accepted usingd. The normal approximation to the binomial.arrow_forward
- C-Spec, Incorporated is attempting to determine whether an existing machine is capable of milling an engine part that has a key specification of 4 ± 0.003 inch. After a trial run on this machine, C-Spec has determined that the machine has a sample mean of 4.001 inches with a standard deviation of 0.002 inch. Calculate the capability index ( Cpk��� ) for this machine. Note: Round your answer to 3 decimal places. Should C-Spec use this machine to produce this part? multiple choice Yes Noarrow_forwardA manufacturer is selling pharmaceuticals that have a weight specification 199.8 to 200.2 mg, with a target value of 200 mg. Before sending its next shipment, the company collects a large sample of product and determines the mean weight of the sample is 199.89 mg, with a standard deviation of 0.035 mg. The process capability index for the current process is ____. Round to three decimal places.arrow_forwardSampling error is defined as: an error that occurs when a sample of less than 30 elements is drawn. an error that occurs during collection, recording, and tabulation of data. the difference between the value of a sample statistic and the value of the corresponding population parameter.arrow_forward
arrow_back_ios
SEE MORE QUESTIONS
arrow_forward_ios
Recommended textbooks for you
- Practical Management ScienceOperations ManagementISBN:9781337406659Author:WINSTON, Wayne L.Publisher:Cengage,Operations ManagementOperations ManagementISBN:9781259667473Author:William J StevensonPublisher:McGraw-Hill EducationOperations and Supply Chain Management (Mcgraw-hi...Operations ManagementISBN:9781259666100Author:F. Robert Jacobs, Richard B ChasePublisher:McGraw-Hill Education
- Purchasing and Supply Chain ManagementOperations ManagementISBN:9781285869681Author:Robert M. Monczka, Robert B. Handfield, Larry C. Giunipero, James L. PattersonPublisher:Cengage LearningProduction and Operations Analysis, Seventh Editi...Operations ManagementISBN:9781478623069Author:Steven Nahmias, Tava Lennon OlsenPublisher:Waveland Press, Inc.
Practical Management Science
Operations Management
ISBN:9781337406659
Author:WINSTON, Wayne L.
Publisher:Cengage,
Operations Management
Operations Management
ISBN:9781259667473
Author:William J Stevenson
Publisher:McGraw-Hill Education
Operations and Supply Chain Management (Mcgraw-hi...
Operations Management
ISBN:9781259666100
Author:F. Robert Jacobs, Richard B Chase
Publisher:McGraw-Hill Education
Purchasing and Supply Chain Management
Operations Management
ISBN:9781285869681
Author:Robert M. Monczka, Robert B. Handfield, Larry C. Giunipero, James L. Patterson
Publisher:Cengage Learning
Production and Operations Analysis, Seventh Editi...
Operations Management
ISBN:9781478623069
Author:Steven Nahmias, Tava Lennon Olsen
Publisher:Waveland Press, Inc.